
Proceedings Paper
SIM-Lite: status of the engineering progress toward flightFormat | Member Price | Non-Member Price |
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Paper Abstract
We present an overview of the ongoing progress towards flight readiness of the SIM project. We summarize the
engineering milestones that have been completed in the last two years, namely: the Brass-Board Internal and
External Metrology Beam Launchers, the Brass-Board Metrology Source, and the Instrument Communication
Hardware/Software Architecture Demonstration. We also show other progress such as: the life test of the bass-screw
and PZT actuators, building the Metrology Fiducials and the Single Strut Test Article. We status the
ongoing work on the Brass-Board Fast Steering Mirror and the Brass-Board Astrometric Beam Combiner. We
end with a proposed path towards finishing the Brass-Board suite.
Paper Details
Date Published: 28 July 2008
PDF: 12 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70134U (28 July 2008); doi: 10.1117/12.789828
Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)
PDF: 12 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70134U (28 July 2008); doi: 10.1117/12.789828
Show Author Affiliations
Frank G. Dekens, Jet Propulsion Lab. (United States)
Eric E. Bloemhof, Jet Propulsion Lab. (United States)
Serge Dubovitsky, Jet Propulsion Lab. (United States)
Daniel Eldred, Jet Propulsion Lab. (United States)
Eric E. Bloemhof, Jet Propulsion Lab. (United States)
Serge Dubovitsky, Jet Propulsion Lab. (United States)
Daniel Eldred, Jet Propulsion Lab. (United States)
Renaud Goullioud, Jet Propulsion Lab. (United States)
Muthu Jeganathan, Jet Propulsion Lab. (United States)
Fabien Nicaise, Jet Propulsion Lab. (United States)
Feng Zhao, Jet Propulsion Lab. (United States)
Muthu Jeganathan, Jet Propulsion Lab. (United States)
Fabien Nicaise, Jet Propulsion Lab. (United States)
Feng Zhao, Jet Propulsion Lab. (United States)
Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)
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