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Proceedings Paper

Performance of a cryogenic Michelson interferometer
Author(s): Philippe Lagueux; Martin Chamberland; Frédérick Marcotte; André Villemaire; Marc Duval; Jérôme Genest; Adriaan Carter
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Paper Abstract

A cryogenic Fourier transform infrared spectrometer (Cryo-FTS) was developed for the Low Background Infrared (LBIR) facility at the National Institute of Standards and Technology (NIST). This spectrometer was developed for the Missile Defense Agency Transfer Radiometer (MDXR) that will be used to calibrate infrared sources that cannot be transported to NIST for calibration. When used inside the MDXR, the Cryo-FTS provides relative spectral measurements with a repeatability better than 1 % over the spectral range from 3 μm to 15 μm and at a spectral resolution of 0.6 cm-1. This level of performance is enabled by the use of an advancec real-time resampling method. The compact interferometer uses a compensated Michelson configuration and has an operating temperature range between 10 K and 340 K with very low static beam redirection (< 215 μrad). The interferometer uses flat mirrors and a KBr beamsplitter and compensator. This optics maintains low wavefront distortion for infrared beams of up to 2 cm diameter and 5 mrad divergence. It integrates a digitally servo-controlled porchswing mechanism to provide an accurate and repeatable optical path difference and is supported by a Wavefront Alignment (WA) system to correct for wavefront residual tilt in real time using a fibre optic coupled metrology system. The interferometer provides modulation efficiency of better than 44% with limited power dissipation (< 2.8 W) during operation.

Paper Details

Date Published: 23 July 2008
PDF: 11 pages
Proc. SPIE 7018, Advanced Optical and Mechanical Technologies in Telescopes and Instrumentation, 70182C (23 July 2008); doi: 10.1117/12.787988
Show Author Affiliations
Philippe Lagueux, Telops, Inc. (Canada)
Martin Chamberland, Telops, Inc. (Canada)
Frédérick Marcotte, Telops, Inc. (Canada)
André Villemaire, Telops, Inc. (Canada)
Marc Duval, Telops, Inc. (Canada)
Jérôme Genest, Laval Univ. (Canada)
Adriaan Carter, National Institute of Standards & Technology (United States)

Published in SPIE Proceedings Vol. 7018:
Advanced Optical and Mechanical Technologies in Telescopes and Instrumentation
Eli Atad-Ettedgui; Dietrich Lemke, Editor(s)

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