
Proceedings Paper
General performance analysis of a Fizeau interferometerFormat | Member Price | Non-Member Price |
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Paper Abstract
A Fizeau interferometer combines the light of several telescopes to obtain panoramic images with an angular
resolution equivalent to the longest edge-to-edge separation in the system. The overall performance of a Fizeau
interferometer depends critically on the performance of the (MC)AO system and the efficiency of atmospheric
piston correction, but also on other effects like alignment accuracies, filter bandwidths, tracking errors, atmospheric
dispersion and field rotation. Due to the mutual dependence, Strehl ratio or fringe contrast like in
conventional Adaptive Optics systems or pupil plane interferometers are not sufficient for a consice assessment
of the performance of such an instrument. As a measure for the actual performance, we propose to use the ratio
R23, which is the actual high-spatial frequency information in the images, divided by what could be measured
in principal with a 23m telescope (as the LBT). We present the theoretical concept of this method and show
the results of various simulations of the abovementioned effects as an application to LINC-NIRVANA, a Fizeau
interferometer currently being built for the LBT.
Paper Details
Date Published: 28 July 2008
PDF: 12 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70133C (28 July 2008); doi: 10.1117/12.787807
Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)
PDF: 12 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70133C (28 July 2008); doi: 10.1117/12.787807
Show Author Affiliations
Sebastian E. Egner, Max-Planck-Institute for Astronomy (Germany)
Thomas M. Herbst, Max-Planck-Institute for Astronomy (Germany)
Thomas M. Herbst, Max-Planck-Institute for Astronomy (Germany)
Carmelo Arcidiacono, INAF, Osservatorio Astrofisico di Padova (Italy)
Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)
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