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Proceedings Paper

The testing scheme for the LAMOST focal plane plate
Author(s): Zengxiang Zhou; Yi Jin; Jianping Wang; Xiaofeng Li; Xiaozheng Xing
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Paper Abstract

At present, the LAMOST project is in a crucial period. The machining progressing of LAMOST Focal Plane Plate has completed. The inspection of the machining quality for the Focal Plane Plate in the machining process is a pivotal work. In all of the design requirements, the most crucial standards of accuracy are the profile tolerance and the unit-holes dimensional angle. Theirs precision will influence the observation efficiency of the LAMOST. But there are more than 4000 unit-holes on the 1.75m diameter Focal Plane Plate, it is impossible to measure all unit-holes and the whole area of the Focal Plane Plate. How to measure the minimal unit-hole and get the most accurate results about the machining process, judge whether the final machining Focal Plane Plate satisfy the design requirements. The measurement scheme optimization is discussed in the paper. There are two different ways to measure the Focal Plane Plate, one is the traditional way whish use specially designed implements for the every individual parameter, the other way used the CMM to measure the pivotal design requirements such as unit-hole dimensional angle and the profile tolerance of the Focal Plane Plate. The advantage of this is saving the time and cost on the CMM, improving the efficiency for the whole measurement work, and acquires the direct vision results before measuring the Focal Plane Plate on CMM. Whereas the implement which used in the measurement need to design and machine precisely for the credible measurement results. And all the measuring work is calibrated by the CMM sampling detection. The sampling detection based on the processing technology and some implements are mentioned in the paper.

Paper Details

Date Published: 11 July 2008
PDF: 10 pages
Proc. SPIE 7014, Ground-based and Airborne Instrumentation for Astronomy II, 701442 (11 July 2008);
Show Author Affiliations
Zengxiang Zhou, Univ. of Science and Technology of China (China)
Yi Jin, Univ. of Science and Technology of China (China)
Jianping Wang, Univ. of Science and Technology of China (China)
Xiaofeng Li, Univ. of Science and Technology of China (China)
Xiaozheng Xing, Univ. of Science and Technology of China (China)

Published in SPIE Proceedings Vol. 7014:
Ground-based and Airborne Instrumentation for Astronomy II
Ian S. McLean; Mark M. Casali, Editor(s)

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