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Proceedings Paper

Quality estimation of thick-film resistor terminations based on electrical parameters extraction
Author(s): Konrad Kiełbasiński; Małgorzata Jakubowska; Jerzy Kalenik; Anna Młożniak
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Paper Abstract

The RoHS and WEEE regulation forced the large investigations for environmental friendly materials in electronic. The Lead and cadmium which was the significant component of resistors and conductors used in thick-film technology have to be replaced. Quick and precise measurement techniques need to be elaborated to maintain consumer's demand. Usually the test samples with the conductive and resistive layers were used for electrical parameters measurements. The layer thickness measurements and mean value of resistance allowed calculating the sheet resistance. Such a method of measurement have very serious disadvantage. The calculated mean value can be significantly affected by resistors terminations, especially if silver conductor is used, which is known as an easily migrating material. The solution was known and involved preparing and printing samples with the reference terminations. Silver platinum and silver palladium conductors are less susceptible to migration, therefore they were used in previous investigations. The reference terminations improves the precision of calculating sheet resistance, however they enlarges the number of measurements and its influence could still be significant. The authors proposed completely new method of sheet resistance calculation. Such a calculated value called True Sheet Resistance do not depend on the phenomena taking place at the termination, The second evaluated value called Offset indicates the influence of the terminations on measured resistance, and also termination quality. Its value is correlated with the diffusion rate at the interface between conductive film and resistive film at the termination. The usability of this method was proven by performing multiple firing test. One kind of resistive layer was printed on different kinds of conductive layers. The samples were fired sequently and measured. Then the old method of resistor properties evaluation was compared to the new one.

Paper Details

Date Published: 28 December 2007
PDF: 6 pages
Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371T (28 December 2007); doi: 10.1117/12.784705
Show Author Affiliations
Konrad Kiełbasiński, Institute of Electronic Materials Technology (Poland)
Warsaw Univ. of Technology (Poland)
Małgorzata Jakubowska, Institute of Electronic Materials Technology (Poland)
Jerzy Kalenik, Warsaw Univ. of Technology (Poland)
Anna Młożniak, Institute of Electronic Materials Technology (Poland)

Published in SPIE Proceedings Vol. 6937:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007
Ryszard S. Romaniuk, Editor(s)

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