
Proceedings Paper
Research on key technologies of non-contact measurement system of optical aspheric surfaceFormat | Member Price | Non-Member Price |
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Paper Abstract
According to the requirement of high precision measurement of optical aspheric surface, 4D measurement platform is
under development. Open motion control system is adapted and multi-axes motion control card is mounted in IPC.
Repeatability accuracy and positioning accuracy of the full travel of the driving unit of the platform can reach to 0.3μm
and 1μm respectively. Laser sensor is droven by the ultrasonic LM (USLM) to the position needed to be tested. The fine
positioning of the unit is achieved by USLM with its DC drive mode, which can perform nanometer steps proportional to
the input voltages. The positioning error of the driving unit can not be prevented. In this paper, the mathematic model of
error compensation of the USLM driving unit is found and software compensation is introduced. Results of
compensation show that the position accuracy of this driving unit is greatly improved and can fulfill the task of optical
aspheric mirror surface measurement.
Paper Details
Date Published: 27 November 2007
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672359 (27 November 2007); doi: 10.1117/12.783748
Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672359 (27 November 2007); doi: 10.1117/12.783748
Show Author Affiliations
Gujin Liu, Xiamen Univ. (China)
Yinbiao Guo, Xiamen Univ. (China)
Yinbiao Guo, Xiamen Univ. (China)
Jianchun Liu, Xiamen Univ. (China)
Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)
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