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Proceedings Paper

Down-to-the-runway enhanced flight vision system (EFVS) approach test results
Author(s): John B. McKinley; Eric Heidhausen; James A. Cramer; Norris J. Krone Jr.
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Paper Abstract

Flight tests where conducted at Cambridge-Dorchester Airport (KCGE) and Easton Municipal Airport / Newnam Field (KESN) in a Cessna 402B aircraft using a head-up display (HUD) and a Kollsman Enhanced Vision System (EVS-I) infrared camera. These tests were sponsored by the MITRE Corporation's Center for Advanced Aviation System Development (CAASD) and the Federal Aviation Administration. Imagery of the EVS-I infrared camera, HUD guidance cues, and out-the-window video were each separately recorded at an engineering workstation for each approach, roll-out, and taxi operation. The EVS-I imagery was displayed on the HUD with guidance cues generated by the mission computer. Also separately recorded was the inertial flight path data. Enhanced Flight Vision System (EFVS) approaches were conducted from the final approach fix to runway flare, touchdown, roll-out and taxi using the HUD and EVS-I sensor as the only visual reference. Flight conditions included two-pilot crew, day, night, non-precision course offset approaches, ILS approach, crosswind approaches, and missed approaches. Results confirmed the feasibility for safe conduct of down-to-the-runway precision approaches in low visibility to runways with and without precision approach systems, when consideration is given to proper aircraft instrumentation, pilot training, and acceptable procedures. Operational benefits include improved runway occupancy rates, and reduced delays and diversions.

Paper Details

Date Published: 15 April 2008
PDF: 12 pages
Proc. SPIE 6957, Enhanced and Synthetic Vision 2008, 69570J (15 April 2008); doi: 10.1117/12.783722
Show Author Affiliations
John B. McKinley, Univ. Research Foundation (United States)
Eric Heidhausen, Univ. Research Foundation (United States)
James A. Cramer, Univ. Research Foundation (United States)
Norris J. Krone Jr., Univ. Research Foundation (United States)

Published in SPIE Proceedings Vol. 6957:
Enhanced and Synthetic Vision 2008
Jeff J. Güell; Maarten Uijt de Haag, Editor(s)

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