
Proceedings Paper
Down-to-the-runway enhanced flight vision system (EFVS) approach test resultsFormat | Member Price | Non-Member Price |
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Paper Abstract
Flight tests where conducted at Cambridge-Dorchester Airport (KCGE) and Easton Municipal Airport / Newnam Field
(KESN) in a Cessna 402B aircraft using a head-up display (HUD) and a Kollsman Enhanced Vision System (EVS-I)
infrared camera. These tests were sponsored by the MITRE Corporation's Center for Advanced Aviation System
Development (CAASD) and the Federal Aviation Administration. Imagery of the EVS-I infrared camera, HUD
guidance cues, and out-the-window video were each separately recorded at an engineering workstation for each
approach, roll-out, and taxi operation. The EVS-I imagery was displayed on the HUD with guidance cues generated by
the mission computer. Also separately recorded was the inertial flight path data. Enhanced Flight Vision System
(EFVS) approaches were conducted from the final approach fix to runway flare, touchdown, roll-out and taxi using the
HUD and EVS-I sensor as the only visual reference. Flight conditions included two-pilot crew, day, night, non-precision
course offset approaches, ILS approach, crosswind approaches, and missed approaches. Results confirmed the
feasibility for safe conduct of down-to-the-runway precision approaches in low visibility to runways with and without
precision approach systems, when consideration is given to proper aircraft instrumentation, pilot training, and acceptable
procedures. Operational benefits include improved runway occupancy rates, and reduced delays and diversions.
Paper Details
Date Published: 15 April 2008
PDF: 12 pages
Proc. SPIE 6957, Enhanced and Synthetic Vision 2008, 69570J (15 April 2008); doi: 10.1117/12.783722
Published in SPIE Proceedings Vol. 6957:
Enhanced and Synthetic Vision 2008
Jeff J. Güell; Maarten Uijt de Haag, Editor(s)
PDF: 12 pages
Proc. SPIE 6957, Enhanced and Synthetic Vision 2008, 69570J (15 April 2008); doi: 10.1117/12.783722
Show Author Affiliations
John B. McKinley, Univ. Research Foundation (United States)
Eric Heidhausen, Univ. Research Foundation (United States)
Eric Heidhausen, Univ. Research Foundation (United States)
James A. Cramer, Univ. Research Foundation (United States)
Norris J. Krone Jr., Univ. Research Foundation (United States)
Norris J. Krone Jr., Univ. Research Foundation (United States)
Published in SPIE Proceedings Vol. 6957:
Enhanced and Synthetic Vision 2008
Jeff J. Güell; Maarten Uijt de Haag, Editor(s)
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