
Proceedings Paper
Laboratory radiation calibration experiments of TDI CCD cameraFormat | Member Price | Non-Member Price |
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Paper Abstract
Radiation calibration is a necessary part in making camera. In fact, the essential of radiometric calibration is not only used in visible light and infrared light. The calibration is also needed in many measurement and exploration process. The essential of calibration accurately is to confirm the relationship of measurement values and physical quantity. The task of radiometric calibration of TDI CCD camera is to make certain the relationship between the input radiance parameters and the output gray values. The radiometric calibration of TDI CCD camera is done in the State Key Laboratory of Applied Optics. An integration sphere is used for simulating different radiance, which is decided by the sun vertex angle and reflectivity of ground. The linearity of TDI CCD response and the relationships between the response and the gain and stage separately are tested. According to test results, we get the parameters including gains and stages, which are sent to the camera. The errors are discussed after the experiments terminate.
Paper Details
Date Published: 17 January 2008
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234C (17 January 2008); doi: 10.1117/12.783631
Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234C (17 January 2008); doi: 10.1117/12.783631
Show Author Affiliations
Yaxia Liu, Beijing Institute of Clothing Technology (China)
Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)
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