
Proceedings Paper
All-dielectric broadband non-polarizing parallel plate beam splitter operating between 450-650nmFormat | Member Price | Non-Member Price |
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Paper Abstract
Past research on all-dielectric non-polarizing beam splitter is reviewed. With the aid of needle thin film synthesis method and conjugate graduate refining method, three non-polarizing parallel plate beam splitters with different split ratios over a 200nm spectral range centered at 550nm with incidence angle 45° are designed. Selection of material components and initial stack are based on Costich and Thelen's theory. The results of design and analysis show that it maintains a very low polarization ratio in the working range of spectrum and has a reasonable angular field.
Paper Details
Date Published: 14 November 2007
PDF: 6 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67221C (14 November 2007); doi: 10.1117/12.782995
Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yaolong Chen; Ernst-Bernhard Kley; Rongbin Li, Editor(s)
PDF: 6 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67221C (14 November 2007); doi: 10.1117/12.782995
Show Author Affiliations
Wenliang Wang, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Shenming Xiong, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Shenming Xiong, Institute of Optics and Electronics (China)
Yundong Zhang, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yaolong Chen; Ernst-Bernhard Kley; Rongbin Li, Editor(s)
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