
Proceedings Paper
Effective analysis of arrays of nanospheres for near-field enhancement and subwavelength imaging in the optical regionFormat | Member Price | Non-Member Price |
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Paper Abstract
Recently there has been a number of studies of single-layer and double-layer arrays of small resonant particles made of a
noble metal. The intense interest to these structures is caused by their promising properties for near-field enhancement
and subwavelength imaging applications, especially in the optical range. They have substantial advantages over the
structures containing DNG (double negative) materials as they are easier in fabrication and may mitigate the problem of
losses. So far the super-resolution properties were theoretically investigated only for the arrays of a finite extent. In this
work we consider single-layer and multilayer infinite arrays. This formulation allows to build a highly effective
algorithm and to consider both the problem of excitation of a periodic structure by a single dipole and the modal
properties of the structure. The field produced by a single dipole source is effectively described by using the array
scanning method, accelerated by the Ewald method. Each subwavelength sphere is represented as an electric dipole
scatterer. Special attention is given to the investigation of the number of layers influence on local field enhancement and
to the study of the field distribution between the layers.
Paper Details
Date Published: 6 May 2008
PDF: 9 pages
Proc. SPIE 6987, Metamaterials III, 698704 (6 May 2008); doi: 10.1117/12.781160
Published in SPIE Proceedings Vol. 6987:
Metamaterials III
Nigel P. Johnson; Ekmel Özbay; Nikolay I. Zheludev; Richard W. Ziolkowski, Editor(s)
PDF: 9 pages
Proc. SPIE 6987, Metamaterials III, 698704 (6 May 2008); doi: 10.1117/12.781160
Show Author Affiliations
Pekka Alitalo, Helsinki Univ. of Technology (Finland)
Sergei Tretyakov, Helsinki Univ. of Technology (Finland)
Sergei Tretyakov, Helsinki Univ. of Technology (Finland)
Published in SPIE Proceedings Vol. 6987:
Metamaterials III
Nigel P. Johnson; Ekmel Özbay; Nikolay I. Zheludev; Richard W. Ziolkowski, Editor(s)
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