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Proceedings Paper

Fabrication and characterization of an SOI-based thermally tuned phase modulator
Author(s): Asuquo B. Eniang; Bassey E. Obiesio; Kufre Akpan; Christopher Raum
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Paper Abstract

The key process steps in the fabrication of a thermally-tuned silicon-on-insulator (SOI) based phase modulator are detailed. By altering the waveguide temperature, the thermo-optic effect is used to vary the modulator's output. Additionally, various experimental approaches are used to determine the operating characteristics of the resulting device. This includes a swept wave system (SWS) suitable for testing the performance of the phase modulator. Analyses will yield such measurements as insertion loss, polarization dependent loss (PDL), peak wavelength, and ripple period.

Paper Details

Date Published: 8 November 2007
PDF: 11 pages
Proc. SPIE 6796, Photonics North 2007, 679632 (8 November 2007); doi: 10.1117/12.779380
Show Author Affiliations
Asuquo B. Eniang, Algonquin College (Canada)
Bassey E. Obiesio, Algonquin College (Canada)
Kufre Akpan, Algonquin College (Canada)
Christopher Raum, Carleton Univ. (Canada)

Published in SPIE Proceedings Vol. 6796:
Photonics North 2007
John Armitage, Editor(s)

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