
Proceedings Paper
Spectral signatures for RDX-based explosives in the 3 micron regionFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Explosive compounds such as RDX, and HMX present significant challenges to optically based sensors. This
difficulty is due in part to the low vapor pressures these compounds possess. One approach for sensing explosives
that circumvents the low explosive vapor pressure problem, involves focusing on the trace amounts of relatively
high vapor pressure impurities that will be present in the vapor signature. In order to effectively detect these volatile
impurities, the spectral signature databases must be readily available. One of our goals therefore, is the generation
of a database of high resolution spectral signatures for these volatile organic impurities. Some rather formidable
spectroscopic measurement challenges have been encountered while working to extend the spectral signature effort
to the 3 micron region. Here we will outline progress to date, with a focus on the volatile organic compounds
formaldehyde, acetaldehyde, nitromethane, acetone, isobutene, and cyclohexanone.
Paper Details
Date Published: 15 April 2008
PDF: 9 pages
Proc. SPIE 6945, Optics and Photonics in Global Homeland Security IV, 69451S (15 April 2008); doi: 10.1117/12.777874
Published in SPIE Proceedings Vol. 6945:
Optics and Photonics in Global Homeland Security IV
Craig S. Halvorson; Daniel Lehrfeld; Theodore T. Saito, Editor(s)
PDF: 9 pages
Proc. SPIE 6945, Optics and Photonics in Global Homeland Security IV, 69451S (15 April 2008); doi: 10.1117/12.777874
Show Author Affiliations
Tabetha Osborn, Arkansas State Univ. (United States)
Sindhu Kaimal, Arkansas State Univ. (United States)
Sindhu Kaimal, Arkansas State Univ. (United States)
Scott W. Reeve, Arkansas State Univ. (United States)
William Burns, Arkansas State Univ. (United States)
William Burns, Arkansas State Univ. (United States)
Published in SPIE Proceedings Vol. 6945:
Optics and Photonics in Global Homeland Security IV
Craig S. Halvorson; Daniel Lehrfeld; Theodore T. Saito, Editor(s)
© SPIE. Terms of Use
