
Proceedings Paper
Design, fabrication, and characterization of LiNbO3 optical modulator for high-sensitivity mmW imaging systemFormat | Member Price | Non-Member Price |
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Paper Abstract
Recently, our group has developed a high-sensitivity millimeter-wave (mmW) imaging system based on optical
upconversion. In such a system, native mmW radiation of objects is first collected by a broadband horn antenna, which
feed the mmW signal to Co-Planar Waveguide (CPW) on a Lithium Niobate(LN) Electro Optical (EO) modulator. The
mmW power is then transferred to the sidebands of an optical carrier due to phase modulation. Detection is realized by
measuring the optical power transferred to the sidebands. The overall performance of the imaging system is highly
dependent on the conversion efficiency of the EO modulator, which is a function of the frequency of the collected
millimeter-wave energy. In this paper, we present the design, fabrication and experimental results towards realizing LN
EO modulators for use in the 95 GHz imaging band.
Paper Details
Date Published: 18 April 2008
PDF: 9 pages
Proc. SPIE 6948, Passive Millimeter-Wave Imaging Technology XI, 694808 (18 April 2008); doi: 10.1117/12.777571
Published in SPIE Proceedings Vol. 6948:
Passive Millimeter-Wave Imaging Technology XI
Roger Appleby; David A. Wikner, Editor(s)
PDF: 9 pages
Proc. SPIE 6948, Passive Millimeter-Wave Imaging Technology XI, 694808 (18 April 2008); doi: 10.1117/12.777571
Show Author Affiliations
Peng Yao, Univ. of Delaware (United States)
Rownak Shireen, Univ. of Delaware (United States)
Julien Macario, Univ. of Delaware (United States)
Rownak Shireen, Univ. of Delaware (United States)
Julien Macario, Univ. of Delaware (United States)
Christopher A. Schuetz, Univ. of Delaware (United States)
Shouyuan Shi, Univ. of Delaware (United States)
Dennis W. Prather, Univ. of Delaware (United States)
Shouyuan Shi, Univ. of Delaware (United States)
Dennis W. Prather, Univ. of Delaware (United States)
Published in SPIE Proceedings Vol. 6948:
Passive Millimeter-Wave Imaging Technology XI
Roger Appleby; David A. Wikner, Editor(s)
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