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Proceedings Paper • Open Access

A perspective on the reliability of MEMS-based components for telecommunications
Author(s): John C. McNulty

Paper Abstract

Despite the initial skepticism of OEM companies regarding reliability, MEMS-based devices are increasingly common in optical networking. This presentation will discuss the use and reliability of MEMS in a variety of network applications, from tunable lasers and filters to variable optical attenuators and dynamic channel equalizers. The failure mechanisms of these devices will be addressed in terms of reliability physics, packaging methodologies, and process controls. Typical OEM requirements will also be presented, including testing beyond of the scope of Telcordia qualification standards. The key conclusion is that, with sufficiently robust design and manufacturing controls, MEMS-based devices can meet or exceed the demanding reliability requirements for telecommunications components.

Paper Details

Date Published: 18 February 2008
PDF: 11 pages
Proc. SPIE 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII, 68840B (18 February 2008); doi: 10.1117/12.773640
Show Author Affiliations
John C. McNulty, DfR Solutions LLC (United States)

Published in SPIE Proceedings Vol. 6884:
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
Allyson L. Hartzell; Rajeshuni Ramesham, Editor(s)

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