Share Email Print

Proceedings Paper

C-arm based cone-beam CT using a two-concentric-arc source trajectory: system evaluation
Author(s): Joseph Zambelli; Tingliang Zhuang; Brian E. Nett; Cyril Riddell; Barry Belanger; Guang-Hong Chen
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The current x-ray source trajectory for C-arm based cone-beam CT is a single arc. Reconstruction from data acquired with this trajectory yields cone-beam artifacts for regions other than the central slice. In this work we present the preliminary evaluation of reconstruction from a source trajectory of two concentric arcs using a flat-panel detector equipped C-arm gantry (GE Healthcare Innova 4100 system, Waukesha, Wisconsin). The reconstruction method employed is a summation of FDK-type reconstructions from the two individual arcs. For the angle between arcs studied here, 30°, this method offers a significant reduction in the visibility of cone-beam artifacts, with the additional advantages of simplicity and ease of implementation due to the fact that it is a direct extension of the reconstruction method currently implemented on commercial systems. Reconstructed images from data acquired from the two arc trajectory are compared to those reconstructed from a single arc trajectory and evaluated in terms of spatial resolution, low contrast resolution, noise, and artifact level.

Paper Details

Date Published: 19 March 2008
PDF: 8 pages
Proc. SPIE 6913, Medical Imaging 2008: Physics of Medical Imaging, 69134U (19 March 2008); doi: 10.1117/12.772781
Show Author Affiliations
Joseph Zambelli, Univ. of Wisconsin, Madison (United States)
Tingliang Zhuang, Univ. of Wisconsin, Madison (United States)
Brian E. Nett, Univ. of Wisconsin, Madison (United States)
Cyril Riddell, GE Healthcare (France)
Barry Belanger, GE Healthcare (United States)
Guang-Hong Chen, Univ. of Wisconsin, Madison (United States)

Published in SPIE Proceedings Vol. 6913:
Medical Imaging 2008: Physics of Medical Imaging
Jiang Hsieh; Ehsan Samei, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?