
Proceedings Paper
A rigorous finite-element domain decomposition method for electromagnetic near field simulationsFormat | Member Price | Non-Member Price |
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Paper Abstract
Rigorous computer simulations of propagating electromagnetic fields have become an important tool for optical
metrology and design of nanostructured optical components. A vectorial finite element method (FEM) is a good
choice for an accurate modeling of complicated geometrical features. However, from a numerical point of view
solving the arising system of linear equations is very demanding even for medium sized 3D domains. In numerics,
a domain decomposition method is a commonly used strategy to overcome this problem. Within this approach
the overall computational domain is split up into smaller domains and interface conditions are used to assure
continuity of the electromagnetic field. Unfortunately, standard implementations of the domain decomposition
method as developed for electrostatic problems are not appropriate for wave propagation problems. In an earlier
paper we therefore proposed a domain decomposition method adapted to electromagnetic field wave propagation
problems. In this paper we apply this method to 3D mask simulation.
Paper Details
Date Published: 7 March 2008
PDF: 9 pages
Proc. SPIE 6924, Optical Microlithography XXI, 692450 (7 March 2008); doi: 10.1117/12.771989
Published in SPIE Proceedings Vol. 6924:
Optical Microlithography XXI
Harry J. Levinson; Mircea V. Dusa, Editor(s)
PDF: 9 pages
Proc. SPIE 6924, Optical Microlithography XXI, 692450 (7 March 2008); doi: 10.1117/12.771989
Show Author Affiliations
Lin Zschiedrich, Zuse Institute Berlin (Germany)
JCMwave GmbH (Germany)
Sven Burger, Zuse Institute Berlin (Germany)
JCMwave GmbH (Germany)
JCMwave GmbH (Germany)
Sven Burger, Zuse Institute Berlin (Germany)
JCMwave GmbH (Germany)
Achim Schädle, Zuse Institute Berlin (Germany)
Frank Schmidt, Zuse Institute Berlin (Germany)
JCMwave GmbH (Germany)
Frank Schmidt, Zuse Institute Berlin (Germany)
JCMwave GmbH (Germany)
Published in SPIE Proceedings Vol. 6924:
Optical Microlithography XXI
Harry J. Levinson; Mircea V. Dusa, Editor(s)
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