Share Email Print

Proceedings Paper

Correlating overlay metrology precision to interlayer dielectric film properties
Author(s): Kris R. Paserba
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Current ITRS projections indicate that overlay metrology measurement uncertainty requirements will be less than 1 nm by the year 2009. The challenge in attaining this level of precision for semiconductor and thin-film head (TFH) applications is complicated by the use of increasingly complex multilayer dielectric stacks in the fabricated devices. This paper details results from a fundamental study designed to quantify and understand the effects of dielectric film optical properties on overlay metrology uncertainty. Overlay precision was measured for a series of advanced imaging metrology (AIM) targets having a region of interest (ROI) ranging from 2.8 - 19.5 μm and mark pitch ranging from 1.9 - 4.5 μm. The interlayer dielectric (ILD) film separating the layers of relevance was systematically varied in both thickness (0 - 5 μm) and refractive index (1.60 - 2.54). A reasonable correlation is observed between the measured precision values and the Rayleigh optical thickness, indicating that the optical clarity of ILD films contributes significantly to the minimum achievable overlay metrology precision.

Paper Details

Date Published: 24 March 2008
PDF: 12 pages
Proc. SPIE 6922, Metrology, Inspection, and Process Control for Microlithography XXII, 69221F (24 March 2008); doi: 10.1117/12.771723
Show Author Affiliations
Kris R. Paserba, Seagate Technology LLC (United States)

Published in SPIE Proceedings Vol. 6922:
Metrology, Inspection, and Process Control for Microlithography XXII
John A. Allgair; Christopher J. Raymond, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?