Share Email Print

Proceedings Paper

Development of high-speed InGaAs linear array and camera for OCT and machine vision
Author(s): Douglas S. Malchow; Robert M. Brubaker; Hai Nguyen; Kevin Flynn
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Spectral Domain Optical Coherence Tomography (SD-OCT) is a rapidly growing imaging technique for high-resolution visualization of structures within strongly scattering media. It is being used to create 2-D and 3-D images in biological tissues to measure structures in the eye, image abnormal growths in organ tissue, and to assess the health of arterial walls. The ability to image to depths of several millimeters with resolutions better than 5 microns has driven the need to maximize the image depth, while also increasing the imaging speed. Researchers are using short-wave-infrared light wavelengths from 1 to 1.6 microns to penetrate deeper in denser tissue than visible or NIR wavelengths. This, in turn, has created the need to increase the line rates of InGaAs linear array cameras by a factor of ten, while also increasing gain and reducing dead time. This paper will describe the development and characterization of a 1024 pixel linear array with 25 micron pitch and readout rate of over 45,000 lines per second and the resulting camera. This camera will also have application for machine vision inspection of hot glass globs, for sorting of fast moving agricultural materials and for quality control of pharmaceutical products.

Paper Details

Date Published: 5 February 2008
PDF: 9 pages
Proc. SPIE 6890, Optical Components and Materials V, 68900G (5 February 2008); doi: 10.1117/12.771540
Show Author Affiliations
Douglas S. Malchow, Sensors Unlimited, Goodrich Corp. (United States)
Robert M. Brubaker, Sensors Unlimited, Goodrich Corp. (United States)
Hai Nguyen, Sensors Unlimited, Goodrich Corp. (United States)
Kevin Flynn, Sensors Unlimited, Goodrich Corp. (United States)

Published in SPIE Proceedings Vol. 6890:
Optical Components and Materials V
Michel J. F. Digonnet; Shibin Jiang; John W. Glesener; J. Christopher Dries, Editor(s)

© SPIE. Terms of Use
Back to Top