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Proceedings Paper

Highly reliable and bright GaN vertical LED on metal alloy substrate using corrugated pyramid shaped surface technology
Author(s): Jiunn-Yi Chu; Chen-Fu Chu; Chao-Chen Cheng; Wen-Huan Liu; Hao-Chun Cheng; Feng-Hsu Fan; Jui-Kang Yen; Chuong Anh Tran; Trung Doan
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Paper Abstract

GaN vertical LED on metal alloy substrate (VLEDMS) is a desirable technology suitable for solid state lighting application from the viewpoint of reliability and lighting efficacy performance. A new top surface engineering technique for efficient light extraction is employed to VLEDMS to improve power conversion efficiency further. Corrugated pyramid shaped (CPS) surfaces are developed and formed on VLEDMS. By using such structure, VLEDMS exhibit a great enhancement of around 20% in light output power, and a high efficiency of over 100 lumens per watt can also be achieved by white LEDs. In the life test, the light output power of VLEDMS chips drop only by less than 10% within 3,000 hours, and the chips can also endure over 1000 cycles of thermal shocks without significant variations in electro-optical performance. Therefore, the highly reliable and bright VLEDMS using CPS surface engineering technique is very suitable for the solid-state lighting application.

Paper Details

Date Published: 15 February 2008
PDF: 6 pages
Proc. SPIE 6894, Gallium Nitride Materials and Devices III, 68940X (15 February 2008); doi: 10.1117/12.768191
Show Author Affiliations
Jiunn-Yi Chu, Semi-Photonics Co., Ltd. (Taiwan)
Chen-Fu Chu, Semi-Photonics Co., Ltd. (Taiwan)
Chao-Chen Cheng, Semi-Photonics Co., Ltd. (Taiwan)
Wen-Huan Liu, Semi-Photonics Co., Ltd. (Taiwan)
Hao-Chun Cheng, Semi-Photonics Co., Ltd. (Taiwan)
Feng-Hsu Fan, Semi-Photonics Co., Ltd. (Taiwan)
Jui-Kang Yen, Semi-Photonics Co., Ltd. (Taiwan)
Chuong Anh Tran, SemiLEDs Corp. (United States)
Trung Doan, SemiLEDs Corp. (United States)

Published in SPIE Proceedings Vol. 6894:
Gallium Nitride Materials and Devices III
Hadis Morkoç; Cole W. Litton; Jen-Inn Chyi; Yasushi Nanishi; Euijoon Yoon, Editor(s)

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