
Proceedings Paper
Highly dispersive dielectric transmission gratings with 100% diffraction efficiencyFormat | Member Price | Non-Member Price |
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Paper Abstract
A new approach for the realization of highly dispersive dielectric transmission gratings is presented. By covering
conventional transmission gratings with a plane substrate a complete suppression of any reflection losses and, thus,
100% diffraction efficiency can be achieved. Theoretical design considerations, a physical investigation of the
diffraction as well as very promising experimental results are shown.
Paper Details
Date Published: 6 February 2008
PDF: 8 pages
Proc. SPIE 6883, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics, 68830U (6 February 2008); doi: 10.1117/12.767783
Published in SPIE Proceedings Vol. 6883:
Advanced Fabrication Technologies for Micro/Nano Optics and Photonics
Thomas J. Suleski; Winston V. Schoenfeld; Jian Jim Wang, Editor(s)
PDF: 8 pages
Proc. SPIE 6883, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics, 68830U (6 February 2008); doi: 10.1117/12.767783
Show Author Affiliations
Tina Clausnitzer, Friedrich-Schiller-Univ. Jena (Germany)
Thomas Kämpfe, Friedrich-Schiller-Univ. Jena (Germany)
Frank Brückner, Friedrich-Schiller-Univ. Jena (Germany)
Roland Heinze, Friedrich-Schiller-Univ. Jena (Germany)
Thomas Kämpfe, Friedrich-Schiller-Univ. Jena (Germany)
Frank Brückner, Friedrich-Schiller-Univ. Jena (Germany)
Roland Heinze, Friedrich-Schiller-Univ. Jena (Germany)
Ernst-Bernhard Kley, Friedrich-Schiller-Univ. Jena (Germany)
Andreas Tünnermann, Friedrich-Schiller-Univ. Jena (Germany)
Olivier Parriaux, Univ. de Saint-Etienne (France)
Alexandre V. Tishchenko, Univ. de Saint-Etienne (France)
Andreas Tünnermann, Friedrich-Schiller-Univ. Jena (Germany)
Olivier Parriaux, Univ. de Saint-Etienne (France)
Alexandre V. Tishchenko, Univ. de Saint-Etienne (France)
Published in SPIE Proceedings Vol. 6883:
Advanced Fabrication Technologies for Micro/Nano Optics and Photonics
Thomas J. Suleski; Winston V. Schoenfeld; Jian Jim Wang, Editor(s)
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