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Proceedings Paper

Feasibility study of enhanced total internal reflection fluorescence imaging using dielectric films
Author(s): Kyujung Kim; Eun-Jin Cho; Yong-Min Huh; Donghyun Kim
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Paper Abstract

We present the sensitivity improvement of total internal reflection fluorescence microscopy for imaging intracellular molecular movements near cell membranes. We investigated employing dielectric films on a prism substrate for the enhancement of fluorescence emission intensity. A two-layer dielectric thin film structure using Al2O3 and SiO2 was designed and fabricated to provide the maximal field enhancement for 442 nm excitation at a reasonable angle of incidence (&Thgr;). The field enhancement achieved by the design was 8.5 at &Thgr; = 53.8º for TE polarization and confirmed experimentally using microbeads. Preliminary results in live cell imaging were obtained using quantum dots.

Paper Details

Date Published: 12 February 2008
PDF: 7 pages
Proc. SPIE 6850, Multimodal Biomedical Imaging III, 68500R (12 February 2008); doi: 10.1117/12.765621
Show Author Affiliations
Kyujung Kim, Yonsei Univ. (South Korea)
Eun-Jin Cho, Yonsei Univ. (South Korea)
Yong-Min Huh, Yonsei Univ. (South Korea)
Donghyun Kim, Yonsei Univ. (South Korea)

Published in SPIE Proceedings Vol. 6850:
Multimodal Biomedical Imaging III
Fred S. Azar; Xavier Intes, Editor(s)

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