Share Email Print

Proceedings Paper

Optical performance of bare image sensor die and sensors packaged at the wafer level and protected by a cover glass
Author(s): G. Humpston; A. Grinman; O. Jackl; M. Ebel
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The yield of solid state camera modules declines with increasing imager resolution. The easiest means of compensating for this trend is to package the imager die before they are assembled into camera modules. The packaging is preferably accomplished at the wafer level. The package cover is a sheet of glass that forms part of the optical train of the solid state camera. This paper discusses the properties required of the glass and describes a computer model that was constructed to provide quantitative insight into its effect on the optical performance of image sensors. The study corroborates practical measurements that the cover glass has no significant effect on the low light sensitivity of a typical camera module. The cover glass does introduce some reflection losses and minor image aberrations, but these can be managed through the combination of attention to the design of the total optical path and making the cover glass as thin as possible.

Paper Details

Date Published: 3 March 2008
PDF: 11 pages
Proc. SPIE 6897, Optoelectronic Integrated Circuits X, 68970U (3 March 2008); doi: 10.1117/12.764716
Show Author Affiliations
G. Humpston, Tessera U.K. (United Kingdom)
A. Grinman, Tessera Israel (Israel)
O. Jackl, Schott AG (Germany)
M. Ebel, Schott AG (Germany)

Published in SPIE Proceedings Vol. 6897:
Optoelectronic Integrated Circuits X
Louay A. Eldada; El-Hang Lee, Editor(s)

© SPIE. Terms of Use
Back to Top