Share Email Print

Proceedings Paper

Highly efficient InGaN/GaN LEDs with double-sided textured surfaces and omni-directional mirror structure
Author(s): Dong-Sing Wuu; Shao-Hua Huang; Ray-Hua Horng; Chuang-Yu Hsieh; Kuo-Wei Yen
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The p-side-up GaN light-emitting diode (LED) were fabricated using a combination of omni-directional reflector (ODR) and double-sided textured surface (both p-GaN and undoped-GaN) techniques. An Essential Macleod program was used to simulate the optimum thickness of the ODR structure. The reflectivity value of ODR structure used in work can reach 99%. On the top-side textured surface, the p-type GaN with hexagonal cavities was grown under low temperature conditions using metalorganic chemical vapor deposition. The GaN LED with a suitable low-temperature p-GaN cap layer thickness was also studied. Experimental results indicate that the LED sample with a 200-nm hexagonal cavity GaN layer on the surface exhibits a 50% enhancement in luminance intensity. For a small chip size of 250 μm×500 μm, the luminance efficiency can be improved from 23.2 to 28.2% at 20 mA. However, the luminance efficiency with a larger chip size of 1mm×1mm can be improved from 19.8 to 28.9%. This indicates that the thin-film structure can enhance the light extraction efficiency of GaN-based LEDs, especially for the large chip sizes.

Paper Details

Date Published: 15 February 2008
PDF: 8 pages
Proc. SPIE 6894, Gallium Nitride Materials and Devices III, 68941E (15 February 2008); doi: 10.1117/12.763248
Show Author Affiliations
Dong-Sing Wuu, National Chung Hsing Univ. (Taiwan)
Shao-Hua Huang, National Chung Hsing Univ. (Taiwan)
Ray-Hua Horng, National Chung Hsing Univ. (Taiwan)
Chuang-Yu Hsieh, National Chung Hsing Univ. (Taiwan)
Kuo-Wei Yen, National Chung Hsing Univ. (Taiwan)

Published in SPIE Proceedings Vol. 6894:
Gallium Nitride Materials and Devices III
Hadis Morkoç; Cole W. Litton; Jen-Inn Chyi; Yasushi Nanishi; Euijoon Yoon, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?