
Proceedings Paper
Fast focus field calculationsFormat | Member Price | Non-Member Price |
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Paper Abstract
We present a method for fast calculation of the electromagnetic field near the focus of an objective with a high numerical
aperture (NA). Instead of direct integration, the vectorial Debye diffraction integral is evaluated with the fast Fourier
transform for calculating the electromagnetic field in the entire focal region. We generalize this concept with the chirp z
transform for obtaining a flexible sampling grid and an additional gain in computation speed. Under the conditions for the
validity of the Debye integral representation, our method yields the amplitude, phase and polarization of the focus field
for an arbitrary paraxial input field in the aperture of the objective. Our fast calculation method is particularly useful for
engineering the point-spread function or for fast image deconvolution.
We present several case studies by calculating the focus fields of high NA oil immersion objectives for various amplitude,
polarization and phase distributions of the input field. In addition, the calculation of an extended polychromatic
focus field generated by a Bessel beam is presented. This extended focus field is of particular interest for Fourier domain
optical coherence tomography because it preserves a lateral resolution of a few micrometers over an axial distance in the
millimeter range.
Paper Details
Date Published: 20 February 2008
PDF: 7 pages
Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 68610R (20 February 2008); doi: 10.1117/12.763188
Published in SPIE Proceedings Vol. 6861:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)
PDF: 7 pages
Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 68610R (20 February 2008); doi: 10.1117/12.763188
Show Author Affiliations
Marcel Leutenegger, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Matthias Geissbuehler, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Iwan Märki, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Matthias Geissbuehler, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Iwan Märki, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Rainer A. Leitgeb, Medical Univ. of Vienna (Austria)
Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Theo Lasser, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Theo Lasser, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Published in SPIE Proceedings Vol. 6861:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)
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