
Proceedings Paper
Characterization of fs-laser written refractive index changes using near-field scanning optical microscopyFormat | Member Price | Non-Member Price |
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Paper Abstract
We have performed measurements using a purpose-built Near-field Scanning Optical Microscope and shown that
waveguides written with a fs laser in the kHz regime have an asymmetry associated with the unidirectional nature of the
writing beam. Further, the asymmetry becomes more pronounced with increasing pulse energy. At very high pulse
energies (5-10 J) the presence of multiple guided regions was also observed, indicating that the refractive index profile
of the waveguide possesses several maxima, a result which is consistent with current studies on the filamentation process
that high-powered laser pulses experience in a dielectric medium. In this paper we will present these observations, their
subsequent analysis and implications for photonic device fabrication using this method.
Paper Details
Date Published: 8 January 2008
PDF: 9 pages
Proc. SPIE 6801, Photonics: Design, Technology, and Packaging III, 680119 (8 January 2008); doi: 10.1117/12.761087
Published in SPIE Proceedings Vol. 6801:
Photonics: Design, Technology, and Packaging III
Wieslaw Z. Krolikowski; Costas M. Soukoulis; Ping Koy Lam; Timothy J. Davis; Shanhui Fan; Yuri S. Kivshar, Editor(s)
PDF: 9 pages
Proc. SPIE 6801, Photonics: Design, Technology, and Packaging III, 680119 (8 January 2008); doi: 10.1117/12.761087
Show Author Affiliations
D. Little, Macquarie Univ. (Australia)
P. Dekker, Macquarie Univ. (Australia)
A. Rahmani, Univ. of Technology Sydney (Australia)
P. Dekker, Macquarie Univ. (Australia)
A. Rahmani, Univ. of Technology Sydney (Australia)
J. Dawes, Macquarie Univ. (Australia)
G. Marshall, Macquarie Univ. (Australia)
M. Withford, Macquarie Univ. (Australia)
G. Marshall, Macquarie Univ. (Australia)
M. Withford, Macquarie Univ. (Australia)
Published in SPIE Proceedings Vol. 6801:
Photonics: Design, Technology, and Packaging III
Wieslaw Z. Krolikowski; Costas M. Soukoulis; Ping Koy Lam; Timothy J. Davis; Shanhui Fan; Yuri S. Kivshar, Editor(s)
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