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Proceedings Paper

Landform classification based on adjacency index of feature lines
Author(s): Mingliang Luo; Guoan Tang; Jieyu Zhou
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Paper Abstract

Landform feature points and lines have been used as basic landform descriptors of landform skeleton in many fields, including surveying, simulation of hydrology, landform classification, and vegetation mapping. With the objective of landform classification from DEMs, an approach has been put forward based on topological parameters and the extended ones. The methodology for landform classification is implemented as a three-step process: choice of appropriate scale for analysis, extraction of feature lines, and quantitative measurement of feature lines. Five parameters, entropy of graphs, edge adjacency index and elevation difference weighted adjacency index, number graphs and density of graphs are used to classify different landforms. The result shows that topological index and descriptive parameters of graphs, aided by mean elevation is capable to classify of the high mountain, Loess Mao, Loess Liang and Low mountain.

Paper Details

Date Published: 3 August 2007
PDF: 12 pages
Proc. SPIE 6751, Geoinformatics 2007: Cartographic Theory and Models, 67511D (3 August 2007); doi: 10.1117/12.760093
Show Author Affiliations
Mingliang Luo, Institute of Mountain Hazards and Environment (China)
Nanjing Normal Univ. (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Guoan Tang, Nanjing Normal Univ. (China)
Jieyu Zhou, Nanjing Normal Univ. (China)

Published in SPIE Proceedings Vol. 6751:
Geoinformatics 2007: Cartographic Theory and Models
Manchun Li; Jiechen Wang, Editor(s)

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