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Proceedings Paper

Characteristic comparisons of Yb-Er co-doped Al2O3 waveguide amplifiers with different geometric structures
Author(s): Shufeng Li; Chengren Li; Zhongfan Liu; Wenxuan Zhu; Changlie Song
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Paper Abstract

Guiding modes and field distribution are calculated by finite element method. For three kinds of etched cross-section waveguide (rectangle, trapezoid, upside-down trapezoid) with 0.5μm and 1.0μm film thickness, mode characteristic, percentage of core power at wavelength of 1.53μm and 0.98μm and overlap factor between signal and pump are contrastively studied. For the same etched depth and mask width, trapezoid waveguide is superior to rectangle and then upside-down trapezoid in the view of field confinement and overlap factor. Whereas rectangle waveguide is optimum and upside-down trapezoid is the worst for the same core cross-section area. The gain of different etched cross-section waveguide amplifier is numerically calculated by multi-theoretical model, which is founded by rate equations pumped at 0.98μm, two-dimension waveguide finite element model, propagation equations with forward and backward direction amplified spontaneous emission. Results also show rectangle waveguide is optimum for the same core cross-section area. The gain of 1μm film thickness waveguide amplifier increases by more than 20% compared with 0.5μm thickness waveguide. These simulation results provide a theoretical basis for the design of Yb-Er co-doped Al2O3 waveguide amplifiers.

Paper Details

Date Published: 8 January 2008
PDF: 6 pages
Proc. SPIE 6838, Optoelectronic Devices and Integration II, 68380K (8 January 2008); doi: 10.1117/12.759400
Show Author Affiliations
Shufeng Li, Dalian Univ. of Technology (China)
Chengren Li, Dalian Univ. of Technology (China)
Liaoning Normal Univ. (China)
Zhongfan Liu, Dalian Univ. (China)
Wenxuan Zhu, Dalian Univ. of Technology (China)
Changlie Song, Dalian Univ. of Technology (China)

Published in SPIE Proceedings Vol. 6838:
Optoelectronic Devices and Integration II
Xuping Zhang; Hai Ming; Maggie Yihong Chen, Editor(s)

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