
Proceedings Paper
Transmission characteristics of T-ray multilayer interference filtersFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
An optical multilayer interference filter is made from two or more different dielectric materials layered in such
a way that it promotes constructive or destructive wave interference for a selected frequency in the direction
normal to the layers. Usually, each layer has the thickness of a quarter of wavelength at which the stop-band
is required. In this paper, a quarter-wavelength multilayer interference filter is realised for T-ray applications.
The dielectric materials used are high-resistivity silicon and free space, both of which have high transparency
to T-rays and flat all-pass responses over the frequencies of interest. The designed thickness of both materials
is in the order of a hundred microns, and thus allows the novelty of a retrofittable assembled structure. An
analysis of the affect of the number of layers on the spectral response is given for the first time. The THz-TDS
measurement of the fabricated structure is demonstrated to be in agreement with theory.
Paper Details
Date Published: 8 January 2008
PDF: 15 pages
Proc. SPIE 6801, Photonics: Design, Technology, and Packaging III, 68011G (8 January 2008); doi: 10.1117/12.758811
Published in SPIE Proceedings Vol. 6801:
Photonics: Design, Technology, and Packaging III
Wieslaw Z. Krolikowski; Costas M. Soukoulis; Ping Koy Lam; Timothy J. Davis; Shanhui Fan; Yuri S. Kivshar, Editor(s)
PDF: 15 pages
Proc. SPIE 6801, Photonics: Design, Technology, and Packaging III, 68011G (8 January 2008); doi: 10.1117/12.758811
Show Author Affiliations
W. Withayachumnankul, The Univ. of Adelaide (Australia)
B. M. Fischer, The Univ. of Adelaide (Australia)
B. M. Fischer, The Univ. of Adelaide (Australia)
Published in SPIE Proceedings Vol. 6801:
Photonics: Design, Technology, and Packaging III
Wieslaw Z. Krolikowski; Costas M. Soukoulis; Ping Koy Lam; Timothy J. Davis; Shanhui Fan; Yuri S. Kivshar, Editor(s)
© SPIE. Terms of Use
