
Proceedings Paper
Fabrication of holey-fiber-based optical patch cords with bending insensitivity and their feasible reliabilityFormat | Member Price | Non-Member Price |
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Paper Abstract
We propose the holey-fiber-based optical cord cables with the excellent optical characteristics in terms of attenuation
loss, insertion loss, and bending loss for the application to access network like FTTH. The attenuation loss of the holey-fiber-
based cord cable with the length of 1 km at 1383 nm is as low as ~0.323 dB/km. The bending loss under the bending diameter of 5.5 mm is measured to be ~0.04 dB. We also test the proposed holey-fiber-based optical cable for E-PON transmission systems by measuring the internet speed in the server under the bending diameter of 7, 3, and 1 cm.
Paper Details
Date Published: 5 February 2008
PDF: 6 pages
Proc. SPIE 6890, Optical Components and Materials V, 68900W (5 February 2008); doi: 10.1117/12.758476
Published in SPIE Proceedings Vol. 6890:
Optical Components and Materials V
Michel J. F. Digonnet; Shibin Jiang; John W. Glesener; J. Christopher Dries, Editor(s)
PDF: 6 pages
Proc. SPIE 6890, Optical Components and Materials V, 68900W (5 February 2008); doi: 10.1117/12.758476
Show Author Affiliations
Young-Geon Han, Hanyang Univ. (South Korea)
Yu Tae Shim, Hanyang Univ. (South Korea)
Seok Ho Song, Hanyang Univ. (South Korea)
Chang-Hyun Jung, Optomagic Co. Ltd. (South Korea)
Yu Tae Shim, Hanyang Univ. (South Korea)
Seok Ho Song, Hanyang Univ. (South Korea)
Chang-Hyun Jung, Optomagic Co. Ltd. (South Korea)
Chi-Hwan Ouh, Optomagic Co. Ltd. (South Korea)
Ki-Sun Ryu, Optomagic Co. Ltd. (South Korea)
Hee-Jeon Kang, Optomagic Co. Ltd. (South Korea)
Sang-Bae Lee, Korea Institute of Science and Technology (South Korea)
Ki-Sun Ryu, Optomagic Co. Ltd. (South Korea)
Hee-Jeon Kang, Optomagic Co. Ltd. (South Korea)
Sang-Bae Lee, Korea Institute of Science and Technology (South Korea)
Published in SPIE Proceedings Vol. 6890:
Optical Components and Materials V
Michel J. F. Digonnet; Shibin Jiang; John W. Glesener; J. Christopher Dries, Editor(s)
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