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Proceedings Paper

Imaging technique for three-dimensional microstructure by digital holography
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Paper Abstract

Digital holography is a whole-field, non-contact, and highly sensitive interferometric imaging and testing technology. It is more suitable for microscopic measurement owing to digitalization and flexibility in holograms recording, storage, reconstruction and transmittance. This paper analyzes the factors which lead to the phase aberrations in the off-axis lensless Fourier transform digital holography firstly. Then a method, which is obtained by borrowing ideas from T. Colomb, is presented to correct the phase aberrations automatically during the numerical reconstruction. This is implemented by multiplying a phase mask directly with the reconstructed wave field. The phase mask is obtained by an iterative procedure computing automatically without the pre-knowledge of the physical parameters, such as the off-set of the reference point source and the recording distance. This method enables one to reconstruct the relative correct and accurate phase-contrast image, even in the presence of the noise, which is needed to be smoothed by a median filter. In order to achieve an accurate phase image, the procedure described here is applied iteratively, starting from the initial values provided by the first evaluation. We present and analyze the simulation results of the phase images based on a special three-dimensional micro object. The results show that for a weak noise the above method is very effective; while for strong noise the common phase-unwrapping method must be applied. This indicates that it is very important to record high quality hologram and to suppress the noise in phase data.

Paper Details

Date Published: 4 January 2008
PDF: 8 pages
Proc. SPIE 6832, Holography and Diffractive Optics III, 683210 (4 January 2008); doi: 10.1117/12.756702
Show Author Affiliations
Huaying Wang, Beijing Univ. of Technology (China)
Hebei Univ. of Engineering (China)
Jie Zhao, Beijing Univ. of Technology (China)
Guangjun Wang, Beijing Univ. of Technology (China)
Henan Institute of Metrology (China)
Yizhuo Zhang, Beijing Univ. of Technology (China)
Dayong Wang, Beijing Univ. of Technology (China)

Published in SPIE Proceedings Vol. 6832:
Holography and Diffractive Optics III
Yunlong Sheng; Dahsiung Hsu; Chongxiu Yu, Editor(s)

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