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Proceedings Paper

Electrically calibrated pyroelectric detector for high-accuracy calibration of UV radiation
Author(s): Xiumei Shao; Jieying Ding; Yuehua Yu; Jiaxiong Fang
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Paper Abstract

A pyroelectric detector with special structure was developed for calibration of UV radiation. A new relaxor-based ferroelectric single crystal with high pyroelectric coefficient was selected as the detector material. The detector is free of substrate and a black coating film was deposited on the surface of the sensitive area. The reflectance of the coating film is less than 1% in the spectral range 200nm to 400nm, and its sheet resistance is near 100 Ohm. Both the UV radiation absorption and the electrically heating in the coating film can result in temperature change. Accordingly, the film can work both as optical absorber and electric heater. By this means, the measurement of UV radiation power can be converted to the measurement of electrical power. The direction of the heat flow is same in both cases, but the mechanism of heat transport has tiny differences. A finite element model was set up by ANSYS software to simulate the thermal diffusivity. The factors which may bring errors to the optical-electrical equivalence were measured and analyzed in detail. The detectors were used to establish UV electrically calibrated system with uncertainty less than 4% in the spectral range from 200nm to 400nm at room temperature.

Paper Details

Date Published: 28 November 2007
PDF: 9 pages
Proc. SPIE 6834, Optical Design and Testing III, 68341E (28 November 2007); doi: 10.1117/12.756552
Show Author Affiliations
Xiumei Shao, Shanghai Institute of Technical Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Jieying Ding, Shanghai Institute of Technical Physics (China)
Yuehua Yu, Shanghai Institute of Technical Physics (China)
Jiaxiong Fang, Shanghai Institute of Technical Physics (China)

Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)

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