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Proceedings Paper

Research of sub-pixel location algorithm based on image correlation
Author(s): Fuwen Li; Chao Xu; Weiqi Jin; Xia Wang
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Paper Abstract

Digital image correlation as a tool for surface deformation measurement has been widely used in the field of experimental mechanics. The method is known to resolve deformation gradient fields with sub-pixel accuracy. In this paper, we address the application of digital image correlation to the image location with sub-pixel accuracy to estimate displacement of multiple frames of video sequences. The estimation effect depends on various factors such as image noise and the correlation algorithm chosen. Algorithms of the sub-pixel location on image are analyzed: Gray-value Interpolation based Image Correlation and Correlation Coefficient Distribution based Fitting. However, Gray-value Interpolation needs a large amount of computational consumption although has high accuracy and it is apt to be influenced by noisy. Correlation Coefficient Distribution has low accuracy but high effective performance. According to the characteristics of these algorithms, a mix algorithm is introduced to improve both accuracy and computational consumption. The imaging process and algorithm execution are simulated using MATLAB. Further more, we could evaluate the displacements of moving objects between two frames of real video sequences and obtain the reconstructed images through displacement data. The validity of the mixed image location algorithm is obviously verified by comparison between original frames and reconstructed image.

Paper Details

Date Published: 8 January 2008
PDF: 7 pages
Proc. SPIE 6835, Infrared Materials, Devices, and Applications, 68351O (8 January 2008); doi: 10.1117/12.756513
Show Author Affiliations
Fuwen Li, Beijing Institute of Technology (China)
Chao Xu, Beijing Institute of Technology (China)
Weiqi Jin, Beijing Institute of Technology (China)
Xia Wang, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 6835:
Infrared Materials, Devices, and Applications
Yi Cai; Haimei Gong; Jean-Pierre Chatard, Editor(s)

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