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Proceedings Paper

Phase-shifting laser diode Sagnac interferometer for surface profile measurement
Author(s): Takamasa Suzuki; Masato Shirai; Osami Sasaki
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Paper Abstract

A phase-shifting Sagnac interferometer that uses wavelength tunability of the laser diode is proposed. A Sagnac interferometer itself is robust for the mechanical disturbances because it has a common path configuration and requires no special reference. Unbalanced optical path introduced between p- and s-polarized beams enables us to implement easy phase-shift by the direct current modulation. Several experimental results indicate that the proposed system is useful for the disturbance-free precise measurement.

Paper Details

Date Published: 26 November 2007
PDF: 8 pages
Proc. SPIE 6829, Advanced Materials and Devices for Sensing and Imaging III, 68290A (26 November 2007); doi: 10.1117/12.756447
Show Author Affiliations
Takamasa Suzuki, Niigata Univ. (Japan)
Masato Shirai, Niigata Univ. (Japan)
Osami Sasaki, Niigata Univ. (Japan)

Published in SPIE Proceedings Vol. 6829:
Advanced Materials and Devices for Sensing and Imaging III
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

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