
Proceedings Paper
Evaluation of the sphericity measurement uncertainty for the fiber point diffraction interferometerFormat | Member Price | Non-Member Price |
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Paper Abstract
Due to the imperfectness of the reference wavefront produced by standard lens, the spherical figure measurement
precision of the traditional interferometer is limited. The fiber point diffraction interferometer (FPDI) provides a method
to produce the nearly perfect reference wavefront for the spherical figure measurement. The diverging wavefront
diffracting from the fiber tip can serve as an ideal reference for the concave spherical surface measurement. However, it
can not serve for the convex surface measurement until an auxiliary positive lens is introduced. This paper presents the
different FPDI configurations for the concave and convex spherical surface measurement. The measurement uncertainty
of the FPDI comes from the following factors: the spherical figure error of the reference wavefront diffracting from the
fiber tips; the flatness of the fiber tips; the phase shifting error of PZT; the tilting error introduced by adjustment during
measurement; the environmental influences such as temperature, vibration, and air turbulence. In all of these factors, the
flatness of the fiber tips mostly affects the measurement uncertainty. The estimation of the expanded uncertainty is about
λ/95 for the concave and λ/40 (λ=532nm) for the convex spherical figure measurement by FPDI.
Paper Details
Date Published: 28 November 2007
PDF: 9 pages
Proc. SPIE 6834, Optical Design and Testing III, 68342N (28 November 2007); doi: 10.1117/12.756190
Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)
PDF: 9 pages
Proc. SPIE 6834, Optical Design and Testing III, 68342N (28 November 2007); doi: 10.1117/12.756190
Show Author Affiliations
Lingfeng Chen, Beijing Institute of Technology (China)
Dingguo Sha, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)
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