
Proceedings Paper
Study on the photo-electrical characteristics of different patterns in dielectric barrier discharge by using photoelectricity methodFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
A dielectric barrier discharge apparatus with two liquid electrodes and a photoelectric detection system are specially
designed to study the photo-electrical characteristic of different patterns. A series of filamentary patterns, in which the
filaments can be fixed for a long time, have been generated from filaments moving stochastically by increasing applied
voltage. It follows the sequence of square pattern, square superlattice pattern and hexagon pattern. The studies of optical
and electrical characteristics, including discharge current, light signals, the voltage drop across discharge gap, transported
charges, and Lissajous figures of these different patterns are realized by the photo-electrical detection method. From the
light signals and waveforms of current, it is found that the square pattern has two discharge pulses, the square
superlattice has three and the hexagon has several pulses in each half cycle of the applied voltage. The voltage drop
across discharge gap and transported charges increase with the increasing of applied voltage. The dissipated power
obtained by the charge-voltage Lissajous figures also increases with the increasing of applied voltage.
Paper Details
Date Published: 28 November 2007
PDF: 8 pages
Proc. SPIE 6834, Optical Design and Testing III, 683427 (28 November 2007); doi: 10.1117/12.755557
Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)
PDF: 8 pages
Proc. SPIE 6834, Optical Design and Testing III, 683427 (28 November 2007); doi: 10.1117/12.755557
Show Author Affiliations
Zengchao Zhao, Hebei Univ. (China)
Yonghui Li, Hebei Univ. (China)
Yonghui Li, Hebei Univ. (China)
Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)
© SPIE. Terms of Use
