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Proceedings Paper

Measurement of partially specular objects by controlling imaging range
Author(s): Joongki Jeong; Deokhwa Hong; Hyungsuck Cho
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Paper Abstract

When specular surface is imaged on a group of CCD cells, the image usually suffers from saturation and blooming problem. This problem is a serious obstacle to applying optical profiling methods based on structured light to specular objects. In this paper, a phase-based profiling system combined with a spatial light modulator in the imaging part is proposed to measure three dimensional shape of partially specular surfaces. The spatial light modulator prevents the image sensor from being saturated. In this way, projected fringes are well imaged and their phase information is correctly extracted. The system configuration and transmittance control scheme are explained in sequence. This idea is verified by experimental results, in which phase information is successfully extracted from the areas which are not normally measurable due to saturation.

Paper Details

Date Published: 8 October 2007
PDF: 10 pages
Proc. SPIE 6718, Optomechatronic Computer-Vision Systems II, 671808 (8 October 2007); doi: 10.1117/12.754548
Show Author Affiliations
Joongki Jeong, Korea Advanced Institute of Science and Technology (South Korea)
Deokhwa Hong, Korea Advanced Institute of Science and Technology (South Korea)
Hyungsuck Cho, Korea Advanced Institute of Science and Technology (South Korea)

Published in SPIE Proceedings Vol. 6718:
Optomechatronic Computer-Vision Systems II
Jonathan Kofman; Yuri Lopez de Meneses; Shun'ichi Kaneko; Claudio A. Perez; Didier Coquin, Editor(s)

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