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Proceedings Paper

Damage thresholds and morphology of the front- and back-irradiated SiO2 thin films containing gold nanoparticles as artificial absorbing defects
Author(s): S. Papernov; A. W. Schmid; J. B. Oliver; A. L. Rigatti
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Paper Abstract

Previous ultraviolet-pulsed, laser-damage studies using model thin films with gold nanoparticles as artificial absorbing defects revealed damage morphology in a form of submicrometer-scaled craters. It was also demonstrated that for defects smaller than 20 nm, crater formation is preceded by plasma-ball formation around absorbing defects. In this work an attempt is made to verify symmetry of the plasma ball by conducting film irradiation from the side of the air/film or substrate/film interfaces. In each case, crater-formation thresholds are derived and crater morphology is analyzed by means of atomic force microscopy.

Paper Details

Date Published: 18 December 2007
PDF: 6 pages
Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 67200G (18 December 2007); doi: 10.1117/12.752616
Show Author Affiliations
S. Papernov, Univ. of Rochester (United States)
A. W. Schmid, Univ. of Rochester (United States)
J. B. Oliver, Univ. of Rochester (United States)
A. L. Rigatti, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 6720:
Laser-Induced Damage in Optical Materials: 2007
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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