
Proceedings Paper
A soft x-ray polarimeter designed for broadband x-ray telescopesFormat | Member Price | Non-Member Price |
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Paper Abstract
A novel approach for measuring linear X-ray polarization over a broad-band using conventional imaging optics
and cameras is described. A new type of high efficiency grating, called the critical angle transmission grating is
used to disperse soft X-rays radially from the telescope axis. A set of multilayer-coated paraboloids re-image the
dispersed X-rays to rings in the focal plane. The intensity variation around these rings is measured to determine
three Stokes parameters: I, Q, and U. By laterally grading the multilayer optics and matching the dispersion of
the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors over 50%
over the entire 0.2 to 0.8 keV band. A sample design is shown that could be used with the Constellation-X
optics.
Paper Details
Date Published: 20 September 2007
PDF: 11 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880Z (20 September 2007); doi: 10.1117/12.746957
Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)
PDF: 11 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880Z (20 September 2007); doi: 10.1117/12.746957
Show Author Affiliations
Herman L. Marshall, MIT Kavli Institute (United States)
Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)
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