
Proceedings Paper
Experimental study of target detection based on vibration and polarization characteristicsFormat | Member Price | Non-Member Price |
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Paper Abstract
A new method of detecting target is presented based on vibration and polarization and a series of experiments have been
done. The frequency difference is modulated by vibration displacement signal. A computer is used to adopt and analyze
the vibration signal. The method has a good potential prospective to be applied in high resolution, low and middle
frequency vibration measurement or random vibration measurement. Vibration imagery offers new possibilities for target
classification, and for investigating and monitoring vibration behavior of large scale structures. Experimental and
theoretical comparisons of laser detecting techniques with and without spatial resolution capability will be presented.
The polarizing characteristics of laser reflected from targets are studied, and some physical parameters of the laser are
given, such as backward reflection energy and polarization degree. In order to discriminate the original polarization radiation and non-polarization radiation, the emission system of laser and the detection system of both vertical polarization and parallel polarization are discussed. Analysis of the measured relative polarization and reflectance consists of single wavelength and multi-wavelength comparisons with man-made and background items. A direct comparison is made between natural and man-made materials and different wavelengths of light.
Paper Details
Date Published: 7 January 2008
PDF: 8 pages
Proc. SPIE 6824, Semiconductor Lasers and Applications III, 68240K (7 January 2008); doi: 10.1117/12.746583
Published in SPIE Proceedings Vol. 6824:
Semiconductor Lasers and Applications III
Lianghui Chen; Hiroyuki Suzuki; Paul T. Rudy; Ninghua Zhu, Editor(s)
PDF: 8 pages
Proc. SPIE 6824, Semiconductor Lasers and Applications III, 68240K (7 January 2008); doi: 10.1117/12.746583
Show Author Affiliations
Changqing Cao, Xidian Univ. (China)
Xiaodong Zeng, Xidian Univ. (China)
Qiang Xu, Xidian Univ. (China)
Xiaodong Zeng, Xidian Univ. (China)
Qiang Xu, Xidian Univ. (China)
Zhejun Feng, Xidian Univ. (China)
Lei Su, Xidian Univ. (China)
Lei Su, Xidian Univ. (China)
Published in SPIE Proceedings Vol. 6824:
Semiconductor Lasers and Applications III
Lianghui Chen; Hiroyuki Suzuki; Paul T. Rudy; Ninghua Zhu, Editor(s)
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