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Proceedings Paper

A novel all-optical label processing for OPS networks based on multiple OOC sequences from multiple-groups OOC
Author(s): Kun Qiu; Chongfu Zhang; Yun Ling; Yibo Wang
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Paper Abstract

This paper proposes an all-optical label processing scheme using multiple optical orthogonal codes sequences (MOOCS) for optical packet switching (OPS) (MOOCS-OPS) networks, for the first time to the best of our knowledge. In this scheme, the multiple optical orthogonal codes (MOOC) from multiple-groups optical orthogonal codes (MGOOC) are permuted and combined to obtain the MOOCS for the optical labels, which are used to effectively enlarge the capacity of available optical codes for optical labels. The optical label processing (OLP) schemes are reviewed and analyzed, the principles of MOOCS-based optical labels for OPS networks are given, and analyzed, then the MOOCS-OPS topology and the key realization units of the MOOCS-based optical label packets are studied in detail, respectively. The performances of this novel all-optical label processing technology are analyzed, the corresponding simulation is performed. These analysis and results show that the proposed scheme can overcome the lack of available optical orthogonal codes (OOC)-based optical labels due to the limited number of single OOC for optical label with the short code length, and indicate that the MOOCS-OPS scheme is feasible.

Paper Details

Date Published: 19 November 2007
PDF: 11 pages
Proc. SPIE 6783, Optical Transmission, Switching, and Subsystems V, 678336 (19 November 2007); doi: 10.1117/12.743021
Show Author Affiliations
Kun Qiu, Univ. of Electronic Science and Technology of China (China)
Chongfu Zhang, Univ. of Electronic Science and Technology of China (China)
Yun Ling, Univ. of Electronic Science and Technology of China (China)
Yibo Wang, Univ. of Electronic Science and Technology of China (China)

Published in SPIE Proceedings Vol. 6783:
Optical Transmission, Switching, and Subsystems V
Dominique Chiaroni; Wanyi Gu; Ken-ichi Kitayama; Chang-Soo Park, Editor(s)

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