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Proceedings Paper

Determination of the dielectric constant of coatings with a capacitance probe
Author(s): A. Guadarrama-Santana; A. García-Valenzuela
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Paper Abstract

This work shows that in many practical situations it is possible to obtain the dielectric constant of coatings on plain conductive substrates by means of a single electrode-sample capacitance measurement without precise knowledge of its thickness. 3D simulations of spherical electrode-dielectric coating-conductive plain substrate capacitive system are performed in order to determine theoretically the suitable electrode dimension for a coating thickness range of interest.

Paper Details

Date Published: 16 May 2007
PDF: 9 pages
Proc. SPIE 6422, Sixth Symposium Optics in Industry, 64221N (16 May 2007); doi: 10.1117/12.742372
Show Author Affiliations
A. Guadarrama-Santana, Univ. Nacional Autónoma de México (Mexico)
A. García-Valenzuela, Univ. Nacional Autónoma de México (Mexico)

Published in SPIE Proceedings Vol. 6422:
Sixth Symposium Optics in Industry
Julio C. Gutiérrez-Vega; Josué Dávila-Rodríguez; Carlos López-Mariscal, Editor(s)

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