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Proceedings Paper

Forward diffracted parametric X radiation from a thick Tungsten single crystal at 855 MeV electron energy
Author(s): H. Backe; W. Lauth; A. F. Scharafutdinov; P. Kunz; A. S. Gogolev; A. P. Potylitsyn
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Paper Abstract

Features of forward diffracted Parametric X-Radiation (PXR) were investigated at experiments with the 855 MeV electron beam of the Mainz Microtron MAMI employing a 410 &mgr;m thick tungsten single crystal. Virtual photons from the electron field are diffracted by the (101)[bar above final 1] plane at a Bragg angle of 3.977°. Forward emitted radiation was analyzed at an energy of 40 keV with the (111) lattice planes of a flat silicon single crystal in Bragg geometry. Clear peak structures were observed in an angular scan of the tungsten single crystal. The results were analyzed with a model which describes forward diffracted PXR under real experimental conditions. The experiments show that forward diffracted PXR may be employed to diagnose bending radii of lattice planes in large area single crystals.

Paper Details

Date Published: 2 May 2007
PDF: 15 pages
Proc. SPIE 6634, International Conference on Charged and Neutral Particles Channeling Phenomena II, 66340Z (2 May 2007); doi: 10.1117/12.741924
Show Author Affiliations
H. Backe, Johannes Gutenberg-Univ. Mainz (Germany)
W. Lauth, Johannes Gutenberg-Univ. Mainz (Germany)
A. F. Scharafutdinov, Johannes Gutenberg-Univ. Mainz (Germany)
P. Kunz, Johannes Gutenberg-Univ. Mainz (Germany)
A. S. Gogolev, Tomsk Polytechnic Univ. (Russia)
A. P. Potylitsyn, Tomsk Polytechnic Univ. (Russia)

Published in SPIE Proceedings Vol. 6634:
International Conference on Charged and Neutral Particles Channeling Phenomena II
Sultan B. Dabagov, Editor(s)

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