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Proceedings Paper

Theoretical and numerical analysis of the microring resonator refractometers
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Paper Abstract

Theoretical and numerical studies regarding the possibility of using simple laterally coupled microring resonators as refractometers are presented in this work. We have considered a core waveguide layer with its refractive index varying in the range 1.5...2 deposed on the silicon dioxide thermal grown layer. The waveguide width is set for achieving single-mode condition at 1.55 &mgr;m radiation wavelength. The aim of this work is finding the optimum configurations for microring resonators based refractive index sensors.

Paper Details

Date Published: 7 May 2007
PDF: 8 pages
Proc. SPIE 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III, 663504 (7 May 2007); doi: 10.1117/12.741829
Show Author Affiliations
Mihai Kusko, IMT-Bucharest (Romania)
Dana Cristea, IMT-Bucharest (Romania)

Published in SPIE Proceedings Vol. 6635:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III
Ovidiu Iancu; Adrian Manea; Paul Schiopu, Editor(s)

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