
Proceedings Paper
3D data merging using HoloimageFormat | Member Price | Non-Member Price |
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Paper Abstract
Three-dimensional data merging is critical for full-field 3-D shape measurement. 3-D range data patches, acquired either
from different sensors or from the same sensor in different viewing angles, have to be merged into a single piece to facilitate
future data analysis. In this research, we propose a novel method for 3-D data merging using Holoimage. Similar to the
3-D shape measurement system using a phase-shifting method, Holoimage is a phase-shifting-based computer synthesized
fringe image. The virtual projector projects the phase-shifted fringe pattern onto the object, the reflected fringe images are
rendered on the screen, and the Holoimage is generated by recording the screen. The 3-D information is retrieved from the
Holoimage using a phase-shifting method. If two patches of 3-D data with overlapping areas are rendered by OpenGL, the
overlapping areas are resolved by the graphics pipeline, i.e., only the front geometry can been visualized. Therefore, the
merging is done if the front geometry information can be obtained. Holoimage is to obtain the front geometry by projecting
the fringe patterns onto the rendered scene. Unlike real world, the virtual camera and projector can be used as orthogonal
projective devices, and the setup of the system can be controlled accurately and easily. Both simulation and experiments
demonstrated the success of the proposed method.
Paper Details
Date Published: 26 September 2007
PDF: 9 pages
Proc. SPIE 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V, 676209 (26 September 2007); doi: 10.1117/12.741459
Published in SPIE Proceedings Vol. 6762:
Two- and Three-Dimensional Methods for Inspection and Metrology V
Peisen S. Huang, Editor(s)
PDF: 9 pages
Proc. SPIE 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V, 676209 (26 September 2007); doi: 10.1117/12.741459
Show Author Affiliations
Song Zhang, Harvard Univ. (United States)
Shing-Tung Yau, Harvard Univ. (United States)
Published in SPIE Proceedings Vol. 6762:
Two- and Three-Dimensional Methods for Inspection and Metrology V
Peisen S. Huang, Editor(s)
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