
Proceedings Paper
Polarimetric scene modeling in the thermal infraredFormat | Member Price | Non-Member Price |
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Paper Abstract
Interest in polarimetric remote sensing is gaining momentum in the visible and remains strong in the microwave
regions of the spectrum. However, passive polarimetric phenomenology in the 3-14 micron infrared (IR) region is
complicated by the relative contributions and complementary polarization orientation of the thermally emitted
and background reflected radiance. Although this modality has found success in specific missions (i.e. surface-laid
landmine and tripwire detection), the dependence on time of day, scene conditions, scene geometry, collection
geometry, etc. makes it difficult to easily perform empirical instrument design or tasking trade studies. This
paper presents improvements to the modeling framework within the Digital Imaging and Remote Sensing Image
Generation (DIRSIG) model to polarimetrically render scenes in the infrared. The DIRSIG model rigorously
treats the polarimetric nature of both thermally emitted and background reflected scene radiance. The correct
modeling of these two components is key to accurately predicting polarized signatures for various instrument
designs and collection scenarios. The DIRSIG polarized BRDF and polarized directional emissivity models are
described and compared to experimentally measured data. Results showing the sensitivity of polarimetric IR
phenomenology to target and background material properties, collection geometry, and scene configuration are
presented.
Paper Details
Date Published: 13 September 2007
PDF: 12 pages
Proc. SPIE 6682, Polarization Science and Remote Sensing III, 66820C (13 September 2007); doi: 10.1117/12.740528
Published in SPIE Proceedings Vol. 6682:
Polarization Science and Remote Sensing III
Joseph A. Shaw; J. Scott Tyo, Editor(s)
PDF: 12 pages
Proc. SPIE 6682, Polarization Science and Remote Sensing III, 66820C (13 September 2007); doi: 10.1117/12.740528
Show Author Affiliations
M. G. Gartley, Rochester Institute of Technology (United States)
S. D. Brown, Rochester Institute of Technology (United States)
A. D. Goodenough, Rochester Institute of Technology (United States)
S. D. Brown, Rochester Institute of Technology (United States)
A. D. Goodenough, Rochester Institute of Technology (United States)
N. J. Sanders, Rochester Institute of Technology (United States)
J. R. Schott, Rochester Institute of Technology (United States)
J. R. Schott, Rochester Institute of Technology (United States)
Published in SPIE Proceedings Vol. 6682:
Polarization Science and Remote Sensing III
Joseph A. Shaw; J. Scott Tyo, Editor(s)
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