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Proceedings Paper

Electro-optical characteristics of active elements of integral and fiber optical devices on the base of conductive polymer
Author(s): Z. Yu. Hotra; V. V. Cherpak; I. P. Hlushyk; P. Y. Stakhira; D. M. Volynyuk
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Paper Abstract

As results of the carried out investigation of vacuum deposited polyaniline (PAN) films, it was found that the index of refraction of deposited films changes with the change in the angle of incidence of laser light; in other words, PAN films are optically anisotropic. In particular, if the deposition temperature T&agr;=1800C, the minimum and maximum refraction indeces are 1.810 and 1.758 respectively; when T&agr;=3600C, they are 1.785 and 1.754 respectively; and when T&agr;=4000C, they are 1.786 and 1.755 respectively. Such results show that the rate of films deposition increases with the increase in deposition temperature; in particular, when T&agr;=3600C and the deposition time is 40 minutes, the film thickness d=353 nm; when T&agr;=4000C and the deposition time is the same, the thickness was 400 nm. As results, by means of variation in PAN films deposition technology, it is possible to control optical characteristics of films, and thin has a wide range of application. Due to redox reactions index was also observed. Such films are of prospects as active elements of integral and fiber optical devices.

Paper Details

Date Published: 9 April 2007
PDF: 3 pages
Proc. SPIE 6608, Lightguides and Their Applications III, 66081C (9 April 2007); doi: 10.1117/12.739734
Show Author Affiliations
Z. Yu. Hotra, Lviv Polytechnic National Univ. (Ukraine)
Rzeszów Univ. of Technology (Poland)
V. V. Cherpak, Lviv Polytechnic National Univ. (Ukraine)
I. P. Hlushyk, Lviv Polytechnic National Univ. (Ukraine)
P. Y. Stakhira, Lviv Polytechnic National Univ. (Ukraine)
D. M. Volynyuk, Lviv Polytechnic National Univ. (Ukraine)

Published in SPIE Proceedings Vol. 6608:
Lightguides and Their Applications III
Jan Wójcik; Waldemar Wójcik, Editor(s)

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