
Proceedings Paper
Cargo identification algorithms facilitating unmanned/unattended inspection at high throughput portalsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
A simple model is presented of a possible inspection regimen applied to each leg of a cargo containers' journey between
its point of origin and destination. Several candidate modalities are proposed to be used at multiple remote locations to
act as a pre-screen inspection as the target approaches a perimeter and as the primary inspection modality at the portal.
Information from multiple data sets are fused to optimize the costs and performance of a network of such inspection
systems. A series of image processing algorithms are presented that automatically process X-ray images of containerized
cargo. The goal of this processing is to locate the container in a real time stream of traffic traversing a portal without
impeding the flow of commerce. Such processing may facilitate the inclusion of unmanned/unattended inspection
systems in such a network. Several samples of the processing applied to data collected from deployed systems are
included. Simulated data from a notional cargo inspection system with multiple sensor modalities and advanced data
fusion algorithms are also included to show the potential increased detection and throughput performance of such a
configuration.
Paper Details
Date Published: 5 October 2007
PDF: 6 pages
Proc. SPIE 6736, Unmanned/Unattended Sensors and Sensor Networks IV, 67360M (5 October 2007); doi: 10.1117/12.738354
Published in SPIE Proceedings Vol. 6736:
Unmanned/Unattended Sensors and Sensor Networks IV
Edward M. Carapezza, Editor(s)
PDF: 6 pages
Proc. SPIE 6736, Unmanned/Unattended Sensors and Sensor Networks IV, 67360M (5 October 2007); doi: 10.1117/12.738354
Show Author Affiliations
Alex Chalmers, American Science and Engineering, Inc. (United States)
Published in SPIE Proceedings Vol. 6736:
Unmanned/Unattended Sensors and Sensor Networks IV
Edward M. Carapezza, Editor(s)
© SPIE. Terms of Use
