Share Email Print

Proceedings Paper

A snapshot distortion test using Moiré fringes
Author(s): Erin Sabatke; Lee Dettmann; Anna Pierce; Derek Sabatke
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We developed a distortion measurement technique that works in snapshot mode. Distortion information across the full field of view can be captured in a single short exposure. To do this, a Ronchi ruling is placed in the object and image planes of the system under test. The undistorted ruling in the image plane interferes with the distorted image of the ruling, producing a Moire fringe pattern that can be analyzed in several ways. Phase shifting can be carried out by shifting the Ronchi ruling in object space. The technique is insensitive to vibration and turbulence. Measurements were routinely made with P-V noise levels of 1 μm on measured chief ray locations in 20 mm image planes (0.01%). Repeated measurements showed disagreements on the 6 μm level across a 20 mm image plane (0.03% repeatability).

Paper Details

Date Published: 21 September 2007
PDF: 12 pages
Proc. SPIE 6676, Optical System Alignment and Tolerancing, 66760D (21 September 2007); doi: 10.1117/12.736305
Show Author Affiliations
Erin Sabatke, Ball Aerospace (United States)
Lee Dettmann, L-3 Communications (United States)
Anna Pierce, Ball Aerospace (United States)
Derek Sabatke, Ball Aerospace (United States)

Published in SPIE Proceedings Vol. 6676:
Optical System Alignment and Tolerancing
José M. Sasian; Mitchell C. Ruda, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?