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Proceedings Paper

Grazing incidence reflection and scattering of MeV protons
Author(s): Bernd Aschenbach
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Paper Abstract

Treating protons as de Broglie waves shows that up to a few MeV energies protons experience total external reflection using the index of refraction concept for the target earlier applied to electrons. Angular distributions can be explained by random surface scattering as known for X-rays. Applied ot the Chandra and XMM-Newton X-ray telescopes the calculated reflection efficiencies can explain the observed degradation of the X-ray CCDs for both missions. Some discussion about the possibility of realizing imaging sub-MeV proton optics is presented.

Paper Details

Date Published: 20 September 2007
PDF: 7 pages
Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880I (20 September 2007); doi: 10.1117/12.735589
Show Author Affiliations
Bernd Aschenbach, Max-Planck-Institut für extraterrestrische Physik (Germany)

Published in SPIE Proceedings Vol. 6688:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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