
Proceedings Paper
A quantitative comparison of three grolishing techniques for the Precessions processFormat | Member Price | Non-Member Price |
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Paper Abstract
The 'Zeeko Classic' polishing process is implemented in a series of CNC machine-tools. The standard tooling utilizes
inflated membranes ('bonnet') covered with standard polishing cloths, and flooded by a supply of re-circulating
polishing slurry. The usual input quality is a part off a precision CNC grinding machine, and the process both polishes
and corrects form. In this paper we demonstrate how dynamic range can be substantially extended using three distinct
Zeeko Grolishing processes that are hybrids between loose-abrasive polishing and bound-abrasive grinding. The output
quality and volumetric removal rates of these processes are compared and contrasted. Finally, we note how these hybrid
processes can extend the capabilities of the machine from polishing and form control, to smoothing parts with inferior
input-quality, removing larger volumes of material during form control, and addressing harder materials.
Paper Details
Date Published: 21 September 2007
PDF: 9 pages
Proc. SPIE 6671, Optical Manufacturing and Testing VII, 66711H (21 September 2007); doi: 10.1117/12.735488
Published in SPIE Proceedings Vol. 6671:
Optical Manufacturing and Testing VII
James H. Burge; Oliver W. Faehnle; Ray Williamson, Editor(s)
PDF: 9 pages
Proc. SPIE 6671, Optical Manufacturing and Testing VII, 66711H (21 September 2007); doi: 10.1117/12.735488
Show Author Affiliations
D. D. Walker, Univ. College London (United Kingdom)
Zeeko Ltd. (United Kingdom)
A. Baldwin, Cranfield Univ. (United Kingdom)
R. Evans, Univ. College London (United Kingdom)
R. Freeman, Zeeko Ltd. (United Kingdom)
S. Hamidi, OpTIC Technium (United Kingdom)
Zeeko Ltd. (United Kingdom)
A. Baldwin, Cranfield Univ. (United Kingdom)
R. Evans, Univ. College London (United Kingdom)
R. Freeman, Zeeko Ltd. (United Kingdom)
S. Hamidi, OpTIC Technium (United Kingdom)
P. Shore, Cranfield Univ. (United Kingdom)
X. Tonnellier, Cranfield Univ. (United Kingdom)
S. Wei, Zeeko Ltd. (United Kingdom)
C. Williams, QioptiQ (United Kingdom)
G. Yu, Univ. College London (United Kingdom)
X. Tonnellier, Cranfield Univ. (United Kingdom)
S. Wei, Zeeko Ltd. (United Kingdom)
C. Williams, QioptiQ (United Kingdom)
G. Yu, Univ. College London (United Kingdom)
Published in SPIE Proceedings Vol. 6671:
Optical Manufacturing and Testing VII
James H. Burge; Oliver W. Faehnle; Ray Williamson, Editor(s)
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